Characterization of a highly-segmented silicon prototype for the TRACE array

Gelain, M.; Mengoni, D.; Lunardi, S.; Dueñas Díaz, José Antonio; Assie, M.

doi:10.1051/epjconf/20146611013

Autoría

Gelain, M.; Mengoni, D.; Lunardi, S.; Dueñas Díaz, José Antonio ; Assie, M.
Fecha de publicación

2014
Editorial

EDP Sciences
Cita bibliográfica

Gelain, M., Mengoni, D., Dueñas Díaz, J.A.,, Assie, M. :"Characterization of a highly-segmented silicon prototype for the TRACE array". EPJ Web of Conferences. Vol. 66, 11013 (2014). ISSN 2100-014X
Resumen

In view of the construction of novel and high-sensitive instrumentation for the emerging ISOL facilities new prototypes have being implemented and tested. The contri- bution focuses at the investigation of the detection efficiency of an innovative silicon-pad prototype, which is the key element for the construction of the TRACE array, pursued for the SPES facility based at the Legnaro National Laboratories (Italy). The inter-pad size has been estimated by using a commercial 100-MHz-14-bit CAEN digitizer for sampling the signals obtained by an alpha-source scan over the inter-pad region.
URI

http://hdl.handle.net/10272/8360

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Characterization of a highly-segmented silicon prototype for the TRACE array

Autoría

Gelain, M.; Mengoni, D.; Lunardi, S.; Dueñas Díaz, José Antonio

; Assie, M.

Fecha de publicación

2014

Editorial

EDP Sciences

Cita bibliográfica

Gelain, M., Mengoni, D., Dueñas Díaz, J.A.,, Assie, M. :"Characterization of a highly-segmented silicon prototype for the TRACE array". EPJ Web of Conferences. Vol. 66, 11013 (2014). ISSN 2100-014X

Resumen

In view of the construction of novel and high-sensitive instrumentation for the emerging ISOL facilities new prototypes have being implemented and tested. The contri- bution focuses at the investigation of the detection efficiency of an innovative silicon-pad prototype, which is the key element for the construction of the TRACE array, pursued for the SPES facility based at the Legnaro National Laboratories (Italy). The inter-pad size has been estimated by using a commercial 100-MHz-14-bit CAEN digitizer for sampling the signals obtained by an alpha-source scan over the inter-pad region.

URI

http://hdl.handle.net/10272/8360

Fichero	Tamaño	Formato	Ver	Descripción
Characterization.pdf	906.9Kb	PDF	Ver/Abrir	versión editor

Fichero	Tamaño	Formato	Ver	Descripción
Characterization.pdf	906.9Kb	PDF	Ver/Abrir	versión editor

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